Linear and nonlinear models for the analysis of repeated measurements / Edward F. Vonesh, Vernon M. Chinchilli.
Series Statistics: textbooks and monographs ; v. 154Editor: New York : Marcel Dekker, c1997Descripción: xii, 560 p. ; 24 cm. + 1 diskette (3 1/2 in.)ISBN: 0824782488Otra clasificación: 62-01 (62H99 62J02 62J05 62J10) Forma de acceso: System requirements for accompanying computer disk: Program written using SAS, tested on IBM PS/2; may run on any PC or mainframe under DOS, Windows, or OS/2 with access to SAS.| Item type | Home library | Shelving location | Call number | Materials specified | Status | Date due | Barcode |
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Instituto de Matemática, CONICET-UNS | Libros ordenados por tema | 62 V946 (Browse shelf) | Available | A-7772 |
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System requirements for accompanying computer disk: Program written using SAS, tested on IBM PS/2; may run on any PC or mainframe under DOS, Windows, or OS/2 with access to SAS.
Includes bibliographical references (p. 523-546) and indexes.
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